|
Products
Charpy/Impact
Testing
Drop
Tower
Pendulum Machines
Automatic Charpy
Machines
Instrumented
Impact Testing
Quality Control
Specimens
Double Pendulum
Dynamic Tear
In-Situ Heating &
Cooling
Automatic
Pendulum Return
Automatic
Specimen Transfer
Percent Shear,
Lateral Expansion, Notch Verification
Digital Optical Comparator
Hardness
Testing
Charpy Data
Fitting
Circuit
Board Testing
Beverage Can Tester
Tongs
Shock Testing
Refurbished Equipment
MultiPurpose
Corrosion Cell
High Temperature
Reference
Electrode
Pressure Vessel
Manufacture
Pre-Owned
Equipment
Buy and
Sell
Analytical
Services
Finite
Element/Fracture
Mechanics
Neutron Transport
Analysis
P-T Curve
Analysis
Experimental
Services
Mechanical
Property Testing
Surveillance
Capsule Testing
Failure
Analysis
Services
Failure Analysis
News &
Information
MPM
Product
News
Directions to MPM
Nuclear News
| |


MPM Shock Tester for Electronic
Component Testing |

Impact Machine for High
Impact Test Velocity |

Drop Tower for Battery Shock Testing |
Introduction
 MPM manufactures shock test machines for component qualification to
various MIL standards. The table top shock test machine, as shown (top
left), is equipped with a pneumatic hammer release and break to
prevent multiple impacts. This system is capable of 3,000 g half-sine
pulses and satisfies MIL standard MIL-STD-883E.
In
addition to the pendulum series, MPM also manufactures drop tower test
machines for impact tests at high velocity. The test machine shown (middle left) was made for shock testing
seat belt buckles at high accelerations consistent with automobile
accidents. The test machine shown (bottom left) was made for shock
testing batteries in accordance with a UN Transportation Specification.
System Features
The MPM shock test system can be configured to satisfy various shock
test requirements. Some important features are listed below:
- Up to 1,000,000 data points per test
- Data acquisition time ranges from microseconds
up to 100 milliseconds (longer acquisition times available)
- User friendly software controls acquisition
and data analysis
- Software calculates peak g level, half-sine
pulse width, and the total energy absorbed by the test piece
throughout the duration of the shock event
- Full system includes:
- Test machine
- Computer
- High speed, 12-bit acquisition board
- Amplifier
- Accelerometer
- Hardware/Software manual
- Software
Options
The test machine can be provided with several options including:
Example Shock Data
The example shock data shown below is for a 500 g
peak load test conducted in accordance with MIL-STD-883E. This standard
is intended for determination of the suitability of devices for use in
electronic equipment that may be subjected to moderately severe shocks as
a result of sudden applied forces or abrupt changes in motion during field
applications. The peak acceleration under Test Condition A must be 500 ±
100 g, and the pulse duration must be within 1 ± 0.3 milliseconds. The
energy absorbed is also reported along with the absorbed energy ratio
which indicates the percent difference between the measured data and the
average half sine pulse specified in the standard.
| Click below to enlarge and
enhance photo |
 |
| Example 500 g Shock Test Data |
Back to Top
|